System and method of simulating aging in device circuits

Abstract

A system and method of simulating device aging based on a digital waveform representative of a workload of an electronic device are disclosed. In one aspect, the method comprises grouping contiguous sets of cycles into segments, each set corresponding to a segment. Each segment has values for a combination of segment parameters that are unique from each of the other segments and a start point that is separated from a start point of an adjacent segment by a pre-defined distance criterion. Grouping the sets into the segments comprises, for each segment: sampling one or more sequential cycles of the workload, generating the segment based on the sampled contiguous cycles having a period exceeding a threshold period, and determining the values for the combination of segment parameters. The method further comprises applying an aging model to the segments to simulate the aging. The segments are a representation of the digital waveform.

Dependencies are inferred from the claim text.