Electrical characteristic acquiring device

An electrical characteristic acquiring device that is mounted on a mounter configured to pick up a component supplied by a component supply device and mount the component on a circuit board, the device being for acquiring an electrical characteristic of the component by a pair of probes gripping the component, the device comprising:

• a measurement section configured to measure the electrical characteristic of the component;
• an open correction value acquisition section configured to acquire an electrical characteristic as an open correction value by calculation when an interval between the pair of probes is a length of the component on an electrode side, based on an electrical characteristic measured by the measurement section when the interval between the pair of probes is a predetermined set length, the set length, and the length of the component on the electrode side;
• and
• a processing section configured to correct the measured electrical characteristic which is the electrical characteristic of the component measured by the measurement section, with at least the open correction value acquired by the open correction value acquisition section to acquire a final electrical characteristic of the component.