Contact probe for probe heads of electronic devices and corresponding probe head

A probe head for testing the functionality of a device under test comprising:

• a plurality of contact probes,
• a single upper guide provided with upper guide holes;
• and
• a single lower guide provided with lower guide holes;
• the upper guide holes and lower guide holes being adapted to house the plurality of contact probes,
• wherein each of the plurality of contact probes has a first end portion which ends with a contact tip configured to abut onto a contact pad of a device under test and a second end portion which ends with a contact head configured to abut onto a contact pad of a board of a testing apparatus, as well as a probe body extended between the first end portion and the second end portion along a longitudinal development axis, the first end portion comprising a first support part, interposed between the probe body and the contact tip,
• wherein the first support part comprises a contact pin and one probe length which extend parallel to each other along the longitudinal development axis and are separated by an air gap;
• and
• wherein the lower guide holes comprise first lower guide holes adapted to house the probe lengths of the contact probes and second lower guide holes adapted to house the contact pins of the contact probes.