Dual frequency comb imaging spectroscopic ellipsometer
AssigneeKLA Corporation
InventorsChao Chang, Jongjin Kim, David Zimdars
Life of this patent
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AssigneeKLA Corporation
InventorsChao Chang, Jongjin Kim, David Zimdars
Estimating the term…
A measurement system may direct an illumination beam including at least one of a first frequency comb or a second frequency comb to a sample, and generate a sequence of images of the sample based on the first frequency comb and the second frequency comb. The system may include one or more coding optical elements to encode data associated with one or more transfer matrix elements into the sequence of images of the sample. The system may further generate a transfer matrix dataset including measurements of at least one of the one or more transfer matrix elements associated with the sample based on at least one of spectral, spatial, or temporal analysis of the sequence of images, and generate one or more measurements of the sample based on the transfer matrix dataset.
A measurement system comprising:
A measurement system comprising:
A measurement method comprising:
Dependencies are inferred from the claim text.