Interferometer-based synthetic multi-exposure speckle imaging (symesi) method and system

A speckle imaging system comprising:

• an optical illumination system of the speckle imaging system including a source of light and configured to produce a light output at an output end thereof, wherein the speckle imaging system is configured to detect a motion;
• an optical interferometer apparatus of the speckle imaging system, the optical interferometer apparatus having a reference arm and a sample arm and optically coupled with the output end of the optical illumination system,
• wherein the optical interferometer apparatus is configured to not require and/or to not allow for, in operation thereof, a change of optical phase difference between a sample light propagating through the sample arm and a reference light propagating through the reference arm;
• an optical imaging system of the speckle imaging system, the optical imaging system containing an optical detector system that is optically cooperated with the output end;
• a computer system, operably connected with the optical imaging system and configured to receive an electrical signal therefrom,
• wherein the electrical signal represents a raw speckle image formed at the optical detector system in light output from the optical interferometer apparatus,
• wherein the light output includes the sample light that has interacted with a target sample in the sample arm and that contains a speckle pattern representing the target sample and the reference light;
• and
• a computer-readable tangible non-transitory medium comprising a computer-readable program code on which are stored computer-readable instructions such that, when the instructions are executed by a processor of the computer system, the instructions cause the processor at least to determine and/or display a speckle contrast characteristic of said raw speckle image.