Circuit for conduction testing of power supply of plasma globe lamp

Abstract

A circuit for conduction testing of a power supply of a plasma globe lamp includes a rectifying circuit and a switching power supply, the circuit for conduction testing of the power supply of the plasma globe lamp is connected with an alternating current output end of an external power supply, a first end of the rectifying circuit is connected with the alternating current output end of the external power supply, a second end of the rectifying circuit is connected with the switching power supply, and the rectifying circuit is configured to convert an alternating current output by the alternating current output end into a direct current and to output the direct current to the switching power supply, and the rectifying circuit includes at least two diodes and a substrate, and all the at least two diodes are integrated in the substrate.

Dependencies are inferred from the claim text.