Memory device including one-time programmable block and operation method thereof
AssigneeSamsung Electronics Co., Ltd.
InventorsJAE-HOON CHOI, SANG-WAN NAM, SANGYONG YOON, KOOKHYUN CHO
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Abstract
A memory package includes a printed circuit board, a first memory device that is stacked on the printed circuit board, and a second memory device stacked on the first memory device. The first memory device includes a first one-time programmable (OTP) block, the second memory device includes a second OTP block different from the first OTP block, and a horizontal distance from one side of the first memory device to the first OTP block is different from a horizontal distance from one side of the second memory device to the second OTP block.
Claims21
1-19. (canceled)
An operation method of a memory device, the method comprising:
- storing data, unassociated with a value indicating a defective block, in a non-defective block at a location of a bad block mark for a plurality of non-defective blocks;
- and
- replying to a host with a fail signal when a normal read command for the non-defective block is received from a host.
An operation method of a data storage device, the method comprising:
- storing data, unassociated with a value indicating a defective block, in a non-defective block among a plurality of non-defective blocks;
- and
- marking a location corresponding to the non-defective block as a bad block.
A memory device comprising:
- a memory cell array comprising a plurality of non-defective blocks;
- and
- an address register configured to store a location corresponding to a selected non-defective block among the plurality of non-defective blocks,
- wherein data stored in the selected non-defective block is unassociated with a value indicating a defective block, and
- wherein the location corresponding to the selected non-defective is marked as a bad block.
Dependencies are inferred from the claim text.