Device and Method for Calibration, Monitoring and Control of the Integrated Photonic Systems

A method for generating a calibration model for a photonic device, a system or a subsystem, the method comprising:

• obtaining indications of control parameters affecting the behavior of the device, a system or a subsystem;
• obtaining a plurality of value sets, each set of the value sets comprising input parameter values,
• obtaining values to be applied, and applying the values to the control parameters;
• applying voltage between two metal layers connected to a p-doped region and an n-doped region of a PIN junction of the photonic device, system or subsystem, the PIN junction comprising the p-doped region, a waveguide and the n-doped region, thereby changing a refraction index of the waveguide;
• measuring values of output parameters the device, system or subsystem as obtained in response to applying the control parameter values and the applied voltage, said measuring performed non-invasively between the two metal layers;
• determining a calibration model of the device, system or subsystem, based on the applied voltage, the at least one set of measured input parameters, applied values of the control parameters and the values of the output parameters;
• and
• storing the calibration model,
• wherein the calibration model is to be applied by measuring values of output parameters of the photonic device and applying the values of the control parameters to the photonic device in a non-invasive manner.