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US 2025/0035492 A1Published application
Temperature-based tamper detection
AssigneeTexas Instruments Incorporated
InventorAnand Kumar G
Life of this patent
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Abstract
A device includes first and second circuits. The first circuit includes a temperature sensor to measure a device temperature. The second circuit operates to send an enable signal to the first circuit to cause the temperature sensor to measure the device temperature; and, in response to not receiving at least one of a ready signal and the device temperature from the first circuit within a set amount of time, output a tamper event signal and a timeout event signal, and disable a valid data signal.
Claims19
A device comprising:
- a first circuit including a temperature sensor configured to measure a device temperature;
- and
- a second circuit configured to:
- send an enable signal to the first circuit to cause the temperature sensor to measure the device temperature;
- and
- in response to not receiving at least one of a ready signal and the device temperature from the first circuit within a set amount of time, output a tamper event signal and a timeout event signal, and disable a valid data signal.
3 more elements
A circuit comprising:
- a trigger generator configured to transmit an enable signal;
- an interface configured to receive a ready signal and a temperature signal indicative of a device temperature;
- a timer coupled to the interface and configured to start counting a set time in response to the enable signal being transmitted;
- and
- an error code generator coupled to the timer;
- wherein, in response to not receiving the ready signal and the temperature signal within a set amount of time,
- the timer is configured to transmit a tamper event signal to the error code generator and to transmit a timeout event signal to the interface, and
- the circuit is configured to de-assert a valid data signal.
5 more elements
A method comprising:
- initiating, by a logic circuit, a timer in response to the logic circuit transmitting an enable signal;
- determining, by the logic circuit, whether at least one of a ready signal and a device temperature signal is received within a set amount of time as measured by the timer;
- de-asserting the enable signal in response to determining that neither the device temperature signal nor the ready signal is received within the set amount of time;
- outputting a tamper event signal and an error code in response to determining that neither the device temperature signal nor the ready signal is received within the set amount of time;
- and
- de-asserting a valid data signal in response to determining that neither the device temperature signal nor the ready signal is received within the set amount of time.
3 more elements
Dependencies are inferred from the claim text.