Calibration jig
AssigneeMitutoyo Corporation
InventorsRyosuke TANAKA, Hikaru SHIGENO, Yuji SADAHIRA
Life of this patent
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Abstract
A calibration jig that calibrates a measurement apparatus for measuring a three-dimensional geometry of a measurement target, including: a plurality of elements to be measured, a frame part to which the plurality of elements to be measured are attached, and a mechanism part that moves the frame part, wherein the mechanism part includes: a rotation mechanism that rotates the frame part about a first axis; a first swinging mechanism that swings the frame part about a second axis orthogonal to the first axis; and a second swinging mechanism that swings the frame part about a third axis orthogonal to the first axis and the second axis.
Claims11
A calibration jig that calibrates a measurement apparatus for measuring a three-dimensional geometry of a measurement target, the calibration jig comprising:
- a plurality of elements to be measured;
- a frame part to which the plurality of elements to be measured are attached;
- and
- a mechanism part that moves the frame part, wherein
- the mechanism part includes:
- a rotation mechanism that rotates the frame part about a first axis;
- a first swinging mechanism that swings the frame part about a second axis orthogonal to the first axis;
- and
- a second swinging mechanism that swings the frame part about a third axis orthogonal to the first axis and the second axis.
Dependencies are inferred from the claim text.