Chemical solution
AssigneeFUJIFILM Corporation
InventorsAkihiko OHTSU, Masahiro YOSHIDOME, Tetsuya KAMIMURA, Ryo SAITO
Life of this patent
Estimating the term…
Loading patent…
AssigneeFUJIFILM Corporation
InventorsAkihiko OHTSU, Masahiro YOSHIDOME, Tetsuya KAMIMURA, Ryo SAITO
Estimating the term…
An object of the present invention is to provide a chemical solution that, in the case of being used in a step of bringing a contact-target member and the chemical solution into contact with each other, is less likely to cause a predetermined defect in the contact-target member. A chemical solution according to the present invention includes an organic solvent and a metal-containing particle including a metal element selected from the group consisting of Fe, Ni, and Zn, wherein an I value determined by a method X is 0.010 to 10.000, method X: the chemical solution is applied onto a substrate to prepare a subject; a surface of the subject is analyzed by being scanned with laser using laser-ablation-inductively coupled plasma-mass spectrometry, to obtain charts for the metal elements in which an abscissa axis indicates laser scanning time and an ordinate axis indicates ion detection intensity; the ion detection intensity of the charts is accumulated for the scanning time to determine accumulated ion detection intensities of the metal elements; the accumulated ion detection intensities of the metal elements are added up to determine a total accumulated ion detection intensity; and the total accumulated ion detection intensity is divided by a laser scanning area to obtain an I value in units of counts/mm2.
A chemical solution comprising:
Dependencies are inferred from the claim text.