Microscope-based system and method for image-guided microscopic illumination

A system for image-guided microscopic laser scanning of varying patterns on a sample through two or more fields of view of the sample, the system comprising at least one processing module configured to:

• control an imaging assembly to acquire a first image of a first field of view of the sample, the first field of view being a subset of the sample;
• process the first image automatically based on a predefined criterion, so as to determine coordinate information of a first region of interest in the first field of view;
• control an illuminating assembly to direct a laser beam at the first field of view following a first pattern corresponding to the coordinate information of the first region of interest in the first field of view;
• and
• control the imaging assembly to acquire a second image of a second field of view, the second field of view being a subset of the sample;
• determine coordinate information of a second region of interest in the second field of view automatically based on the predefined criterion;
• and
• control the illuminating assembly to direct a laser beam at the second field of view following a second pattern corresponding to coordinate information of the second region of interest in the second field of view,
• wherein the second pattern is different from the first pattern.