Measurement device for characterizing a device-under-test

A measurement device for characterizing a device-under-test, DUT, comprising:

• an RF signal generator configured to generate at least two test signals in parallel, wherein the at least two test signals each have a different frequency;
• a signal path connecting the RF signal generator to a port of the measurement device, wherein the port is arranged for being connected to the DUT;
• the signal path being configured to feed the at least two test signals to the port and to receive at least two response signals of the DUT from the port;
• a measurement unit;
• a forward coupler being connected to the signal path and adapted to forward at least a part of each of the at least two test signals to the measurement unit;
• and
• a reverse coupler being connected to the signal path and adapted to forward at least a part of each of the at least two response signals to the measurement unit;
• the measurement unit being adapted to simultaneously measure the forwarded parts of the at least two test signals and the at least two response signals, each in amplitude and phase.