US 2025/0027982 A1 · METHOD, APPARATUS, AND NON-TRANSITORY COMPUTER MEDIUM FOR DETECTING DEFECTS OF A DEVICE UNDER TEST USING TIME-DOMAIN REFLECTOMETRY

Abstract

A method, apparatus, and/or system for soft defects modeling of measurements using time-domain reflectometry. Electro-Optic Sampling based Time-Domain Reflectometry (EOS-TDR) may quickly detect soft defects in a chip under test. For example, EOS-TDR may detect soft defects in each pin from a trace-structure point at a relatively high resolution. To interpret the results in a time sensitive manner, a reference model for chips may be established from chips that are known to have met the expected quality standards. Through automated analysis of the features of the device under test waveform, soft defects of a chip may be detected that would be otherwise undetectable under time constraints, temperature variations, applied current variations, applied voltage variations, vibration variations, moisture variations, or any other kind of possible variation.

Claims20

Dependent claims

A method comprising:

measuring a device under test using at least one time-domain reflectometry measurement of the device under test to generate a device under test waveform;
comparing the device under test waveform with at least one reference waveform, wherein the at least one reference waveform represents at least one time-domain reflectometry measurement of at least one device that is known to satisfy quality standards;
and
determining if the device under test satisfies quality standards based on the result of the comparing.

1 more element

Dependencies are inferred from the claim text.

Facts

Application

18/355,395Filed 19 Jul 2023

Published

23 Jan 2025

Term ends

Not estimatedThe source records don’t support an estimate.

Classification8 codes

G01R 31/11
Locating faults in cables, transmission lines, or networks: using pulse reflection methods
A23B 2/001
Preservation of foods or foodstuffs, in general: details of apparatus, e.g. pressure feed valves or for transport, or loading or unloading…
A23B 2/205
By heating materials in packages which are progressively transported, continuously or stepwise, through the apparatus: with packages on a drum…
B65B 55/02
Preserving, protecting or purifying packages or package contents in association with packaging: sterilising, e.g. of complete packages

Method, apparatus, and non-transitory computer medium for detecting defects of a device under test using time-domain reflectometry

Life of this patent

Method, apparatus, and non-transitory computer medium for detecting defects of a device under test using time-domain reflectometry

Life of this patent

Abstract

Claims20