Method for localizing or tracking emitters
AssigneeAbberior Instruments GmbH
InventorsMatthias REUSS, Roman SCHMIDT
Life of this patent
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Abstract
The disclosure relates to a method and a microscope for localizing and tracking singulated emitters in a sample. A sample is exposed to an intensity distribution of an illumination light comprising a local intensity minimum in a close region of the singulated emitter. The position of the intensity distribution in the sample fluctuates around a nominal position. The sample is excited to emit and the emissions are detected. Measured variables are recorded in such a way that the current positions of the intensity distribution in the sample can be assigned to the detected emissions. A position of the emitter can be estimated from the detected emissions and the assigned current positions of the intensity distribution.
Claims20
A method for localizing or tracking a singulated emitter by means of a MINFLUX method or a STED-MINFLUX method in a sample,
- wherein the sample is exposed to an intensity distribution of an illumination light comprising a local intensity minimum in a close region of the singulated emitter, wherein the illumination light is excitation light or emission inhibition light, in particular STED light, and wherein the illumination light or another light excites the emitter to emit light,
- wherein a measurement of one or more measured variables is performed, from which the respective current position of the intensity distribution of the illumination light (12) in the sample can be determined,
- wherein emissions from the emitter are detected,
- wherein the position of the intensity distribution in the sample fluctuates around a nominal position and in that the measurement is carried out in such a way that the respective current position of the intensity distribution in the sample can be assigned to the detected emissions in each case.
A MINFLUX microscope or STED-MINFLUX microscope for localizing or tracking a singulated emitter in a sample, comprising
- a light source which is configured to provide an illumination light,
- an illumination optical system which is configured to expose the sample to an intensity distribution of the illumination light comprising a local intensity minimum in a close region of the singulated emitter, wherein the illumination light is excitation light or emission inhibition light, in particular STED light, and wherein the illumination light or another light excites the emitter to emit light,
- a microscope control device which is configured to control the MINFLUX microscope or STED-MINFLUX microscope,
- a beam positioning device which is configured to shift the intensity distribution of the illumination light in the sample,
- a detection device which is configured to detect emissions from the emitter,
- wherein the MINFLUX microscope or STED-MINFLUX microscope comprises a measuring device for acquiring measurement data, from which in each case a current position of the intensity distribution of the illumination light in the sample can be determined, wherein the microscope control device is configured to register the respective current position of the intensity distribution of the illumination light in the sample and/or the respective measurement data recorded by the measuring device for a respective detected emission.
Dependencies are inferred from the claim text.