Apparatus for continuously measuring thickness of thin material, method for continuously measuring thickness of thin material using same, and method for manufacturing high-temperature superconducting wire using same

An apparatus for continuously measuring the thickness of a thin material, the apparatus comprising:

• a main frame configured by an upper frame and a lower frame which are provided in a direction crossing with a movement direction of a thin material to be measured and a vertical frame which connects the upper frame and the lower frame;
• an upper slider and a lower slider moved by sliding along guide grooves which are formed in the upper frame and the lower frame;
• an upper confocal sensor provided on the upper slider, and radiating light toward the thin material;
• and
• a lower confocal sensor provided on the lower slider, and radiating light toward the thin material,
• wherein the upper confocal sensor and the lower confocal sensor are disposed on the same axis according to a coaxial driving scheme, and height measurement is performed by receiving light only at a moment when a focus coincides at a measurement position, and
• wherein the upper confocal sensor and the upper slider and the lower confocal sensor and the lower slider are synchronously controlled, and are controlled in conjunction with movement of the thin material.