Method for motion optimized defect inspection by a robotic arm using prior knowledge from plm and maintenance systems
AssigneeHitachi, Ltd.
InventorsSupriya SATHYANARAYANA, Joydeep ACHARYA
Life of this patent
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AssigneeHitachi, Ltd.
InventorsSupriya SATHYANARAYANA, Joydeep ACHARYA
Estimating the term…
A method for object defect detection. The method may include receiving an object on a production line; computing, by a processor, a motion optimized path for a robot arm, wherein the motion optimized path comprises a path for performing a sequence of rotations by the robot arm on the object for image capturing; using the robot arm to grasp the object and moving the robot arm according to the motion optimized path to rotate the object based on the sequence of rotations; capturing, by a camera, a plurality of images of the object while the object is being rotated; performing, by the processor, defect detection on the plurality of images of the object to determine object defect; and for object defect being detected, issuing, by the processor, a defect notification to an operator of the production line.
A method for object defect detection, the method comprising:
A system for object defect detection, the system comprising:
Dependencies are inferred from the claim text.