Radiation-sensitive composition, pattern formation method, and photo-degradable base
AssigneeJsr Corporation
InventorsRyuichi NEMOTO, Kota FURUICHI, Ryosuke NAKAMURA, Tsuyoshi FURUKAWA
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AssigneeJsr Corporation
InventorsRyuichi NEMOTO, Kota FURUICHI, Ryosuke NAKAMURA, Tsuyoshi FURUKAWA
Estimating the term…
A radiation-sensitive composition contains a polymer having an acid-releasable group, and a compound (Q) represented by formula (1). In the formula (1), L1 represents an ester group, —CO—NR3—, a (thio)ether group, or a sulfonyl group. R4 represents a hydrogen atom, a substituted or unsubstituted C1 to C20 monovalent hydrocarbon group, a halogen atom, a hydroxy group, or a nitro group. R5 represents a C1 to C20 monovalent hydrocarbon group, a C1 to C20 monovalent halogenated hydrocarbon group, or a halogen atom, and optionally two R5s taken together represent an alicyclic structure together with the carbon atom(s) between the two R5s. L2 represents a single bond or a divalent linking group.
A radiation-sensitive composition comprising:
A pattern formation method, comprising:
A light-degradable base represented by formula (1):
Dependencies are inferred from the claim text.