Test apparatus, test method, and computer-readable storage medium
AssigneeAdvantest Corporation
InventorsKotaro HASEGAWA, Kouji MIYAUCHI, Go UTAMARU
Life of this patent
Estimating the term…
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AssigneeAdvantest Corporation
InventorsKotaro HASEGAWA, Kouji MIYAUCHI, Go UTAMARU
Estimating the term…
A test apparatus includes: an electrical connection unit to be electrically connected to a terminal of each of a plurality of light emitting devices to be tested; a light source unit for collectively irradiating the plurality of light emitting devices with light; a measuring unit for measuring a photoelectric signal obtained by photoelectrically converting light irradiated by the light source unit and output via the electrical connection unit by each light emitting device; an acquisition unit for acquiring a correction map including a correction value for correcting a variation in intensity of light with which a position of each light emitting device is irradiated by the light source unit; and a determination unit for determining a quality of each light emitting device on a basis of a measurement result by the measuring unit and the correction map acquired by the acquisition unit.
A test apparatus comprising:
A test method comprising:
A test apparatus comprising:
A test method comprising:
Dependencies are inferred from the claim text.