Materials testing probe
AssigneeAlemnis AG
InventorsJean-Marc BREGUET, Benedikt HEIGENHAUSER, Damian FREY
Life of this patent
Estimating the term…
Abstract
Materials testing probe (1) for a materials testing device (100), comprising: a support (3) adapted to be coupled to said materials testing device (100); a passive beam (5) having a length less than 5 mm and extending from said support (3) along a primary axis (A), said beam (5) having a distal extremity (5c) adapted to cooperate with a sample (105) under test at least in a direction parallel to said primary axis (A). Said beam (5) comprises at least one measurement strain gauge (7) configured to measure deformation of said beam (5) at least in a direction parallel to said primary axis (A).
Claims15
Materials testing probe (1) for a materials testing device (100), comprising:
- a support (3) adapted to be coupled to said materials testing device (100);
- a passive beam (5) having a length less than 5 mm and extending from said support (3) along a primary axis (A), said beam (5) having a distal extremity (5c) adapted to cooperate with a sample (105) under test at least in a direction parallel to said primary axis (A);
- wherein said beam (5) comprises at least one measurement strain gauge (7) configured to measure deformation of said beam (5) at least in a direction parallel to said primary axis (A).
Dependencies are inferred from the claim text.