Auto trajectory correction for non-destructive test

A system for performing non-destructive test (NDT) including compensating for surface variation of a test specimen, the system comprising:

• a probe assembly;
• a manipulator mechanically coupled with the probe assembly and configured to position and orient the probe assembly;
• a processor circuit;
• a memory circuit comprising instructions that, when executed by the processor circuit, cause the system to:
• position the probe assembly relative to a surface of the test specimen, using the manipulator, to perform scanning;
• at a first scan location, acquire data indicative of a distance between the probe assembly and the surface of the test specimen;
• determine a corrected probe assembly orientation using the data indicative of the distance;
• and
• at the first scan location, perform an inspection acquisition using the corrected probe assembly orientation, the inspection acquisition separate from an acquisition used for a determination of the distance.

A system for performing non-destructive test (NDT) including compensating for surface variation of a test specimen, the system comprising:

• a means for positioning a probe assembly relative to a surface of the test specimen;
• at a first scan location, a means for acquiring data indicative of a distance between the probe assembly and the surface of the test specimen using a first transducer arrangement of the probe assembly;
• a means for determining a corrected probe assembly orientation using the data indicative of the distance;
• and
• at the first scan location, a means for performing an inspection acquisition using a second transducer arrangement and using the corrected probe assembly orientation, the inspection acquisition separate from an acquisition used for a determination of the distance using the first transducer arrangement.