Back to results
US 2024/0405069 A1Published application
Through-substrate via and method for forming the same
AssigneeTaiwan Semiconductor Manufacturing Company, Ltd.
InventorsChih Hsin Yang, Mao-Nan Wang, Dian-Hau Chen
Life of this patent
Estimating the term…
Abstract
A method includes forming first nanostructures over a first region of a substrate; forming second nanostructures over a second region of the substrate; forming a first gate structure around the first nanostructures; replacing the second nanostructures with isolation regions; and forming a through via extending through isolation regions and into the substrate.
Claims20
A method comprising:
- forming a plurality of first nanostructures over a first region of a substrate;
- forming a plurality of second nanostructures over a second region of the substrate;
- forming a first gate structure around the plurality of first nanostructures;
- replacing the plurality of second nanostructures with a plurality of isolation regions;
- and
- forming a through via extending through the plurality of isolation regions and into the substrate.
3 more elements
A method comprising:
- forming a stack of nanostructures over a substrate;
- forming an epitaxial source/drain region adjacent the stack of nanostructures;
- forming a dummy gate structure over the stack of nanostructures;
- forming a first recess extending through the dummy gate structure and the stack of nanostructures, wherein the recess extends deeper than the epitaxial source/drain region;
- filling the first recess with a dielectric material;
- forming a second recess extending through the epitaxial source/drain region and the dielectric material;
- and
- filling the second recess with a conductive material.
5 more elements
A structure comprising:
- a plurality of epitaxial regions on a substrate;
- a plurality of isolation regions extending into the substrate, wherein the isolation regions of the plurality of isolation regions are respectively sandwiched between neighboring epitaxial regions of the plurality of epitaxial regions;
- a plurality of dielectric layers over the plurality of epitaxial regions and over the plurality of isolation regions;
- and
- a through via extending through the plurality of dielectric layers and into the substrate, wherein the through via is encircled by the plurality of epitaxial regions and the plurality of isolation regions.
2 more elements
Dependencies are inferred from the claim text.