Methods and structures for increasing stability of soft or organic features
AssigneeTokyo Electron Limited
InventorsKatie LUTKER-LEE, Eric Chih-Fang LIU
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AssigneeTokyo Electron Limited
InventorsKatie LUTKER-LEE, Eric Chih-Fang LIU
Estimating the term…
The present disclosure relates to methods and structures of increasing stability of soft or organic features. The methods disclosed herein may include lining soft/organic features with a lining material, depositing a lining material on the soft/organic features, or otherwise fabricating a lining structure. This provides mechanical support for the soft/organic features, thereby increasing stability of the soft/organic features. The methods, structures, and techniques described herein provide mechanical support for a soft/organic feature, thereby enabling better pattern transfer through semiconductor device fabrication processes, especially at reduced pitch and increased aspect ratio. A method for fabricating semiconductor devices may include spin-coating a patternable material on a substrate, patterning the patternable material to form a pattern including one or more protruding structures, and lining sidewalls of each of the one or more protruding structures with a silicon-containing material.
A method for fabricating semiconductor devices, comprising:
A method for fabricating semiconductor devices, comprising:
A method for fabricating semiconductor devices, comprising:
Dependencies are inferred from the claim text.