Memory device related to performing a read operation and method of operating the memory device
AssigneeSK hynix Inc.
InventorsHyun Soo LEE, Kyu Tae PARK
Life of this patent
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AssigneeSK hynix Inc.
InventorsHyun Soo LEE, Kyu Tae PARK
Estimating the term…
The present technology relates to a semiconductor device. In an embodiment, a memory device capable of reducing a time required for a read operation and preventing an HCI phenomenon of a memory cell may include a plurality of voltage regulators configured to generate operation voltages applied to a word line group, a switch control signal generator configured to generate at least one switch control signal controlling to connect or disconnect at least one voltage regulator among the plurality of voltage regulators to or from the word line group, and a plurality of switching circuits each is connected to any one voltage regulator among the plurality of voltage regulators, and connecting the plurality of voltage regulator to the word line group according to the switch control signal in a period in which a pass voltage among the operation voltages is applied to the word line group during a read operation.
A memory device comprising:
A memory device comprising:
Dependencies are inferred from the claim text.