Memory Device Comprising Electrically Floating Body Transistor
AssigneeZeno Semiconductor, Inc.
InventorsJin-Woo Han, Neal Berger, Yuniarto Widjaja
Life of this patent
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Abstract
A semiconductor memory instance is provided that includes an array of memory cells. The array includes a plurality of semiconductor memory cells arranged in at least one column and at least one row. Each of the semiconductor memory cells includes a floating body region configured to be charged to a level indicative of a state of the memory cell. Further includes are a plurality of buried well regions, wherein each of the buried well regions can be individually selected, and a decoder circuit to select at least one of the buried well regions.
Claims20
A semiconductor memory instance comprising:
- an array of semiconductor memory cells, the array comprising at least two memory sub-arrays, each memory sub-array comprising:
- a plurality of said semiconductor memory cells arranged in at least one column and at least one row, wherein at least two of said semiconductor memory cells each include:
- a bipolar device having a floating base region, an emitter, and a collector,
- wherein said floating base region stores a state of said semiconductor memory cell,
- wherein said collector is connected to a buried well region,
- wherein said buried well region is common to said at least two of said semiconductor memory cells in one of said memory sub-arrays;
- wherein when a first semiconductor memory cell of said at least two of said semiconductor memory cells is in a first state and a second semiconductor memory cell of said at least two of said semiconductor memory cells is in a second state, application of a bias applied through said buried well region maintains said first semiconductor memory cell in said first state and said second semiconductor memory cell in said second state;
- a first decoder circuit configured to select at least one of said at least one column or at least one of said at least one row;
- a second decoder circuit configured to select at least one of said memory sub-arrays;
- and
- wherein said buried well region may be set to a first bias condition during a first memory operation and to a second bias condition during a second memory operation.
A semiconductor memory instance comprising:
- an array of semiconductor memory cells, the array comprising at least two memory sub-arrays, each memory sub-array comprising:
- a plurality of said semiconductor memory cells arranged in at least one column and at least one row, wherein at least two of said semiconductor memory cells each include:
- a bipolar device having a floating base region, an emitter, and a collector,
- wherein said floating base region stores a state of said semiconductor memory cell,
- wherein said collector is connected to a buried well region,
- wherein said buried well region is common to said at least two of said semiconductor memory cells in one of said memory sub-arrays;
- wherein when a first semiconductor memory cell of said at least two of said semiconductor memory cells is in a first state and a second semiconductor memory cell of said at least two of said semiconductor memory cells is in a second state, application of a bias applied through said buried well region maintains said first semiconductor memory cell in said first state and said second semiconductor memory cell in said second state;
- wherein said states of said semiconductor memory cells are maintained upon repeated read operations;
- a first decoder circuit configured to select at least one of said at least one column or at least one of said at least one row;
- a second decoder circuit configured to select at least one of said at least two memory sub-arrays;
- and
- wherein said buried well region may be set to a first bias condition during a first memory operation and to a second bias condition during a second memory operation.
Dependencies are inferred from the claim text.