Substrate, substrate inspection method, and display device manufacturing method
AssigneeJapan Display Inc.
InventorTeruaki UCHIYAMA
Life of this patent
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Abstract
According to one embodiment, a substrate includes a display area including a plurality of pixels, a surrounding area that surrounds the display area, and an inspection pad portion provided in the surrounding area, and the inspection pad portion includes a plurality of first pads and a plurality of second pads aligned in a first direction, a plurality of third pads aligned in the first direction, and arranged at positions displaced from the plurality of first pads in a second direction intersecting the first direction, and a plurality of first conductive lines connecting the plurality of first pads with the plurality of third pads, respectively.
Claims20
A substrate comprising:
- a display area including a plurality of pixels;
- a surrounding area that surrounds the display area;
- and
- an inspection pad portion provided in the surrounding area, wherein
- the inspection pad portion comprises:
- a plurality of first pads and a plurality of second pads aligned in a first direction;
- a plurality of third pads aligned in the first direction, and arranged at positions displaced from the plurality of first pads in a second direction intersecting the first direction;
- and
- a plurality of first conductive lines connecting the plurality of first pads with the plurality of third pads, respectively.
An inspection method of inspecting a substrate using a head comprising a plurality of probes,
- the substrate comprising a display area including a plurality of pixels, a surrounding area that surrounds the display area, and an inspection pad portion provided in the surrounding area, wherein the inspection pad portion comprises a plurality of first pads and a plurality of second pads aligned in a first direction, a plurality of third pads aligned in the first direction, and arranged at positions displaced from the plurality of first pads in a second direction intersecting the first direction, and a plurality of first conductive lines connecting the plurality of first pads with the plurality of third pads, respectively,
- the inspection method comprising:
- bringing the plurality of probes into contact with at least the plurality of first pads or the plurality of third pads, and the plurality of second pads;
- and
- inspecting the substrate by supplying inspection signals via the plurality of probes.
A display device manufacturing method, comprising:
- preparing a substrate comprising a display area including a plurality of pixels, a surrounding area that surrounds the display area, and an inspection pad portion provided in the surrounding area, wherein the inspection pad portion comprises a plurality of first pads and a plurality of second pads aligned in a first direction, a plurality of third pads aligned in the first direction, and arranged at positions displaced from the plurality of first pads in a second direction intersecting the first direction, and a plurality of first conductive lines connecting the plurality of first pads with the plurality of third pads, respectively;
- bringing the plurality of probes that a head comprises into contact with at least the plurality of first pads or the plurality of third pads, and the plurality of second pads;
- inspecting the substrate by supplying inspection signals via the plurality of probes;
- and
- cutting the inspection pad portion from the substrate.
Dependencies are inferred from the claim text.