Self-test for imaging device

A method of self-testing an imaging system of a sample handling apparatus, comprising:

• mounting a self-test slide within a sample handling apparatus including an imaging system, wherein the mounted self-test slide is positioned with respect to an image sensor of the imaging system, the self-test slide comprising a pattern positioned on an optically transparent substrate, wherein the pattern includes an array of first features and at least one second feature including a reference side, wherein the array of first features has a minimum linear density greater than or equal to four pixels, and wherein the reference side is rotated at a non-zero angle with respect to an edge of the image sensor;
• acquiring, by the image sensor, image data representing a single image of the pattern;
• receiving, by a data processor, the single image of the pattern;
• determining, by the data processor based upon the received single image of the pattern, at least one of a linear distortion error or a non-linear distortion error for an optical system;
• comparing, by the data processor, at least one of the determined linear distortion error or the non-linear distortion error to a corresponding registration error threshold;
• and
• outputting, by the data processor, a first annunciation when at least one of the determined linear distortion error or the non-linear distortion error is greater than or equal to the corresponding registration error threshold, and outputting, by the data processor, a second annunciation, different than the first annunciation, when the at least one of determined linear distortion error or the non-linear distortion error is less than the corresponding registration error.