Semiconductor integrated circuit evaluation method

Abstract

A semiconductor integrated circuit evaluation method includes an initial setting flow for obtaining a difference correction value from a measured value and a calculated value of unwanted radiation in a semiconductor integrated circuit before implementation of an electromagnetic compatibility countermeasure, and a calculated prediction flow for obtaining a calculated value of unwanted radiation in a semiconductor integrated circuit after implementation of an electromagnetic compatibility countermeasure, correcting the calculated value with the difference correction value, and evaluating whether or not a corrected calculated value conforms to a standard. The initial setting flow and the calculated prediction flow respectively include a step of applying noise elimination processing to the measured value and the calculated value of the unwanted radiation.

Dependencies are inferred from the claim text.