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AssigneeAltera Corporation
InventorsChiew Khiang Kuit, Ching Sia Lim, Ann Poh Gan
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An integrated circuit includes an output circuit. The output circuit includes first, second, and third external contacts, a first output buffer circuit coupled to the first external contact, a first resistive circuit coupled between the first external contact and the second external contact, a second output buffer circuit coupled to the third external contact, and a second resistive circuit coupled between the second external contact and the third external contact. The output circuit has a test mode of operation to test for leakage current on the first and the third external contacts in response to receiving a first voltage applied externally to the first and the second resistive circuits through the second external contact. The output circuit has a user mode of operation wherein a supply voltage is applied externally to the first and the second resistive circuits through the second external contact.
An integrated circuit comprising an output circuit, wherein the output circuit comprises:
A method for testing an integrated circuit in a package, wherein the integrated circuit comprises first and second external pads coupled to input buffer circuits and output buffer circuits, the method comprising:
An integrated circuit comprising an input circuit, wherein the input circuit comprises:
Dependencies are inferred from the claim text.