Adjustable test adapter apparatus and system for multiple qfn device testing

A system for evaluating an electronic device under test (DUT), comprising:

• a circuit board;
• and
• a test apparatus, comprising:
• a body mounted to the circuit board and having an opening over a portion of the circuit board;
• first and second sliders with respective ends that face one another in the opening, positions of the first and second sliders adjustable along a first direction;
• third and fourth sliders with respective ends that face one another in the opening, positions of the third and fourth sliders adjustable along a second direction that is orthogonal to the first direction;
• and
• a clamp configured to apply a clamping force along a third direction to engage the DUT to the portion of the circuit board between the ends of the sliders, the third direction orthogonal to the first and second directions.

A method for testing an electronic device under test (DUT), the method comprising:

• adjusting respective positions of first and second sliders along a first direction in an opening of an adapter body mounted to a circuit board, the first and second sliders having respective ends that face one another in the opening;
• adjusting respective positions of third and fourth sliders along an orthogonal second direction in the opening, the third and fourth sliders having respective ends that face one another in the opening;
• positioning a device under test (DUT) between the ends of the sliders;
• engaging a clamp to apply a clamping force along a third direction to engage the DUT to a portion of the circuit board between the ends of the sliders, the third direction orthogonal to the first and second directions;
• and
• electrically testing the DUT while the DUT is engaged to the portion of the circuit board.