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US 2024/0402104 A1Published application
Multi-beam particle microscope for reducing particle beam-induced traces on a sample
OwnerGero Storeck, David Disterheft +1inventors
InventorsGero Storeck, David Disterheft, Holger Kierey
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Abstract
A multi-beam particle microscope can reduce particle beam-induced traces on a sample at which a high voltage is present. The occurrence of additional residual gas in the sample chamber is reduced using a specific objective lens cable and/or a specific sample stage cable, which are specifically shielded.
Claims20
A multi-beam particle microscope, comprising:
- a vacuum chamber;
- a multi-beam generator configured to produce a first field of a plurality of charged first individual particle beams;
- a first particle optical unit with a first particle optical beam path, the first particle optical unit configured to image the produced individual particle beams onto a sample surface in an object plane so that the first individual particle beams are incident on the sample surface at incidence locations, which define a second field;
- a detection system comprising a plurality of detection regions that define a third field;
- a second particle optical unit with a second particle optical beam path, the second particle optical unit configured to image second individual particle beams, which emanate from the incidence locations in the second field, onto the third field of the detection regions of the detection system;
- an objective lens configured to have the first and the second individual particle beams pass therethrough;
- a beam switch in the first particle optical beam path between the multi-beam generator and the objective lens, the beam switch being in the second particle optical beam path between the objective lens and the detection system;
- a sample stage configured to hold and/or position a sample during a sample inspection;
- a high voltage cable;
- an objective lens cable guided at least sectionally within the vacuum chamber;
- a sample stage cable guided at least sectionally within the vacuum chamber;
- a shield;
- and
- a controller configured to control the multi-beam particle microscope,
- wherein:
- the objective lens comprises a magnetic objective lens and/or an electrostatic objective lens;
- the vacuum chamber is grounded;
- the objective lens and the sample stage are in the vacuum chamber;
- the objective lens is configured to have a high voltage applied thereto via the objective lens cable;
- the sample stage is configured to have a high voltage applied thereto via the sample stage cable;
- and
- the shield is configured to reduce electrostatic discharges between the objective lens cable and the vacuum chamber, or the shield is configured to reduce electrostatic discharges between the sample stage cable and the vacuum chamber.
19 more elements
A multi-beam particle microscope, comprising:
- a vacuum chamber;
- a multi-beam generator configured to produce a first field of a plurality of charged first individual particle beams;
- a first particle optical unit with a first particle optical beam path, the first particle optical unit configured to image the produced individual particle beams onto a sample surface in an object plane so that the first individual particle beams are incident on the sample surface at incidence locations, which define a second field;
- a detection system comprising a plurality of detection regions that define a third field;
- a second particle optical unit with a second particle optical beam path, the second particle optical unit configured to image second individual particle beams, which emanate from the incidence locations in the second field, onto the third field of the detection regions of the detection system;
- an objective lens configured to have the first and the second individual particle beams pass therethrough;
- a beam switch in the first particle optical beam path between the multi-beam generator and the objective lens, the beam switch being in the second particle optical beam path between the objective lens and the detection system;
- a sample stage configured to hold and/or position a sample during a sample inspection;
- a high voltage cable;
- an objective lens cable guided at least sectionally within the vacuum chamber;
- a first insulation supported by the objective lens cable;
- a sample stage cable guided at least sectionally within the vacuum chamber;
- a second insulation supported by the sample stage lens cable;
- a first shield;
- a second shield;
- and
- a controller configured to control the multi-beam particle microscope,
- wherein:
- the objective lens comprises a magnetic objective lens and/or an electrostatic objective lens;
- the vacuum chamber is grounded;
- the objective lens and the sample stage are in the vacuum chamber;
- the objective lens is configured to have a high voltage applied thereto via the objective lens cable;
- the sample stage is configured to have a high voltage applied thereto via the sample stage cable;
- the first shield is configured to reduce electrostatic discharges between the objective lens cable and the vacuum chamber;
- and
- the second shield is configured to reduce electrostatic discharges between the sample stage cable and the vacuum chamber.
23 more elements
Dependencies are inferred from the claim text.