Method for calibrating a spectrometer device

A method for calibrating a spectrometer device, wherein the spectrometer device comprises at least one detector device comprising at least one optical element configured for separating incident light into a spectrum of constituent wavelength components and further comprising a plurality of photosensitive elements, wherein each photosensitive element is configured for receiving at least a portion of one of the constituent wavelength components and for generating a respective detector signal depending on an illumination of the respective photosensitive element by the at least one portion of the respective constituent wavelength component, wherein the method comprises the following steps:

• a) illuminating, by using at least one broadband light source, the spectrometer device through at least one optical interferometer;
• b) determining for the plurality of photosensitive elements a plurality of detectors signals depending on the illumination through the optical interferometer in step a);
• and
• c) determining at least one item of calibration information from the plurality of detector signals;
• wherein the optical interferometer comprises at least one beam splitting device for splitting incident light into at least two illumination paths, wherein the optical interferometer further comprises at least one scanning mirror in a first illumination path and at least one stationary mirror in a second illumination path, wherein, in the method, the scanning mirror is moved along the first illumination path, wherein the stationary mirror is kept stationary, wherein the scanning mirror is moved in a stepwise manner with a stepping frequency of 1 kHz or less, wherein the stepping frequency of the scanning mirror is slower than a maximum readout frequency of the detector device.