Surface shape measuring device and surface shape measurement method
AssigneeTokyo Seimitsu Co., Ltd.
InventorsYoshiyuki KAWATA, Katsufumi MORIYAMA, Hideki MORII
Life of this patent
Estimating the term…
Loading patent…
AssigneeTokyo Seimitsu Co., Ltd.
InventorsYoshiyuki KAWATA, Katsufumi MORIYAMA, Hideki MORII
Estimating the term…
A surface shape measuring device includes a camera that captures the observation image acquired by the optical head, a drive unit that causes the optical head to scan relatively in a scanning direction perpendicular to the measurement target, an encoder for detecting a position of the optical head in the scanning direction with respect to the measurement target, an imaging instructing unit that instructs the camera to capture the observation image based on a position signal output from the encoder for each predetermined interval, a frame dropping occurrence rate calculating unit that calculates a frame dropping occurrence rate indicating an occurrence rate of frame dropping of the camera, and a measurement condition setting unit that sets a measurement condition for measuring a surface shape of the measurement target based on the frame dropping occurrence rate.
A surface shape measuring device that acquires an observation image of a measurement target while causing an optical head to scan relatively to the measurement target in a direction perpendicular to the measurement target, the surface shape measuring device comprising:
A surface shape measurement method for measuring a surface shape by a surface shape measuring device including:
Dependencies are inferred from the claim text.