Position measurement device and position measurement method

A position measurement method comprising:

• irradiating measurement light to a reflective element, receiving reflected light reflected by the reflective element, and acquiring position information of the reflective element in a three-dimensional space;
• irradiating reference measurement light to at least one reference reflective element, receiving reference reflected light reflected by the reference reflective element, and acquiring position information of the reference reflective element in a three-dimensional space;
• and
• correcting the position information of the reflective element using the position information of the reference reflective element.

A position measurement system comprising:

• first circuitry configured to
• irradiate measurement light to a reflective element;
• receive reflected light reflected by the reflective element;
• and
• acquire position information of the reflective element in a three-dimensional space;
• second circuitry configured to
• irradiate reference measurement light to at least one reference reflective element;
• receive reference reflected light reflected by the reference reflective element;
• and
• acquire position information of the reference reflective element in a three-dimensional space, wherein
• the position information of the reflective element is corrected using the position information of the reference reflective element.