Apparatus and method for inspecting surfaces with wavelength analysis
AssigneeBYK Gardner GmbH
InventorUwe Sperling
Life of this patent
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Abstract
An apparatus for examining surface properties of lacquered surfaces, in particular of motor vehicles, having a first illumination device which illuminates a surface to be examined at a first illumination angle, having a second illumination device which illuminates the surface at a second illumination angle, having a first sensor device which records radiation reflected and/or scattered by the surface illuminated by the second illumination device at a first recording angle and outputs at least one value which is characteristic of the radiation reaching the sensor device from the surface, wherein the apparatus has a radiation analysis device which analyses radiation scattered and/or reflected by the surface with regard to its wavelength.
Claims15
An apparatus for examining surface properties of lacquered surfaces, having a first illumination device which illuminates a surface to be examined at a first illumination angle, having a second illumination device which illuminates the surface a second illumination angle, having a first sensor device which detects radiation reflected and/or scattered by the surface illuminated by the second illumination device at a first recording angle,
- wherein the apparatus has a radiation analysis device (which analyses radiation scattered and/or reflected by the surface with respect to its wavelength.
A method for examining surface properties of lacquered surfaces, wherein a first illumination device illuminates a surface to be examined at a first illumination angle, and wherein a second illumination device illuminates the surface at a second illumination angle, and a first sensor device records radiation reflected and/or scattered by the surface illuminated by the second illumination device at a first recording angle and outputs at least one value which is characteristic of the radiation reaching the sensor device from the surface, wherein a radiation analysis device analyzes radiation scattered and/or reflected by the surface with regard to its wavelength.
Dependencies are inferred from the claim text.