System having single-event latch-up detection and mitigation
AssigneeNXP USA, Inc.
InventorsMohamed Suleman Moosa, Gary Edwin Anderson, II, Mehul D. Shroff, George Walter Lange, Antoine Fabien Dubois
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Abstract
A method of detecting and mitigating an SEL is provided. The method includes measuring a current of a first circuit block of a semiconductor device and determining that the measured current exceeds a first threshold. In response to the measured current exceeding the first threshold, a supply voltage of the first circuit block is reduced from a nominal voltage value to a predetermined voltage value. After reducing the supply voltage to the predetermined voltage value, the supply voltage is restored to the nominal voltage value.
Claims20
A method comprising:
- measuring a current of a first circuit block of a semiconductor device;
- determining that the measured current exceeds a first threshold;
- in response to the measured current exceeding the first threshold, reducing a supply voltage of the first circuit block from a nominal voltage value to a predetermined voltage value;
- and
- after reducing the supply voltage to the predetermined voltage value, restoring the supply voltage to the nominal voltage value.
A semiconductor device comprising:
- a first circuit block configured and arranged to receive a first voltage supply signal;
- and
- a power management unit configured and arranged to:
- provide the first voltage supply signal to the first circuit block,
- measure current of the first circuit block,
- reduce the first voltage supply signal from a nominal voltage value to a predetermined voltage value based on the measured current exceeding a first threshold, and
- restore the first voltage supply signal to the nominal voltage value after reducing the first voltage supply signal to the predetermined voltage value.
A method comprising:
- providing, by way of a power management unit, a first voltage supply signal to a first circuit block of a semiconductor device;
- measuring a current of the first circuit block;
- reducing the first voltage supply signal from a nominal voltage value to a predetermined voltage value based on the measured current exceeding a first threshold;
- and
- restoring the first voltage supply signal to the nominal voltage value after reducing the first voltage supply signal to the predetermined voltage value.
Dependencies are inferred from the claim text.