US 2024/0361376 A1 · REMOVING TEST EQUIPMENT NOISE FROM POWER SPECTRAL DENSITY MEASUREMENTS

Abstract

An example method includes the following operations: (i) receiving a device signal from a device under test (DUT); (ii) setting an attenuation value; (iii) applying the attenuation value to the device signal to produce an attenuated device signal for a frequency spectrum analyzing device, where the frequency spectrum analyzing device produces a noise signal; (iv) obtaining a power spectral density value using the frequency spectrum analyzing device, where a power spectral density comprises a power, at a frequency value, of a combined signal that is based on the attenuated device signal and the noise signal; (v) repeating operations (ii), (iii), and (iv) one or more times to produce multiple power spectral density values; (vi) repeating operations (i), (ii), (iii), (iv), and (v) one or more times to add power spectral density values to the multiple power spectral density values; and (vii) obtaining a power spectral density of the device signal.

Claims23

Dependent claims

A method comprising the following operations:

(i) receiving a device signal from a device under test (DUT);
(ii) setting an attenuation value;
(iii) applying the attenuation value to the device signal to produce an attenuated device signal for a frequency spectrum analyzing device, the frequency spectrum analyzing device producing a noise signal;
(iv) obtaining a power spectral density value using the frequency spectrum analyzing device, where a power spectral density comprises a power, at a frequency value, of a combined signal that is based on the attenuated device signal and the noise signal;
(v) repeating operations (ii), (iii), and (iv) one or more times to produce multiple power spectral density values;
(vi) repeating operations (i), (ii), (iii), (iv), and (v) one or more times to add power spectral density values to the multiple power spectral density values;
and
(vii) obtaining a power spectral density of the device signal by removing at least some of the noise signal from the combined signal by performing an optimization process that is based on the multiple power spectral density values.

5 more elements

A system comprising:

one or more apparatuses comprising a frequency spectrum analyzing device that produces a noise signal, the one or more apparatuses being configured to perform operations comprising:
(i) receiving a device signal from a device under test (DUT);
(ii) setting an attenuation value;
(iii) applying the attenuation value to the device signal to produce an attenuated device signal for a frequency spectrum analyzing device, the frequency spectrum analyzing device producing a noise signal;
(iv) obtaining a power spectral density value using the frequency spectrum analyzing device, where a power spectral density comprises a power, at a frequency value, of a combined signal that is based on the attenuated device signal and the noise signal;
(v) repeating operations (ii), (iii), and (iv) one or more times to produce multiple power spectral density values;
and
(vi) repeating operations (i), (ii), (iii), (iv), and (v) one or more times to add power spectral density values to the multiple power spectral density values;
and
one or more processing devices configured to perform operations comprising:
(vii) obtaining a power spectral density of the device signal by removing at least some of the noise signal from the combined signal by performing an optimization process that is based on the multiple power spectral density values.

8 more elements

Dependencies are inferred from the claim text.

Removing test equipment noise from power spectral density measurements

Life of this patent

Removing test equipment noise from power spectral density measurements

Life of this patent

Abstract

Claims23