Methods and systems for measuring optical characteristics of objects
AssigneeUniversity of the Witwatersrand, Johannesburg
InventorsTavares Wagner Buono, Keshaan Singh, Andrew Forbes, Angela Dudley
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AssigneeUniversity of the Witwatersrand, Johannesburg
InventorsTavares Wagner Buono, Keshaan Singh, Andrew Forbes, Angela Dudley
Estimating the term…
The invention relates to methods and systems for measuring optical characteristics of objects, particularly for measuring birefringence of objects. The method comprises directing a uniformly polarised measurement beam onto an object: rotating the state of polarisation of the measurement beam automatically with holograms: detecting polarisation properties of the measurement beam without interacting with the object and after interacting with the object for each state of polarisation of the measurement beam; and using the detected polarization properties of the measurement beam without interacting with the object and after interacting with the object for each the state of polarisation to determine a measurement of birefringence of the object.
A method for measuring an optical characteristic of an object, wherein the method comprises:
The method as claimed in any one of the preceding claims, wherein the method comprises rotating the state of polarisation of the measurement beam a plurality of times by way of a corresponding number of holograms.
The method as claimed in any one of the preceding claims, wherein the at least one optical characteristic of the object measured is birefringence.
The method as claimed in any one of the preceding claims, wherein the each of the holograms is configured to interact with a pair of incident light beams to produce the uniformly polarised measurement beam having a predetermined polarisation state.
The method as claimed in any one of the preceding claims, wherein each of the holograms comprise at least two holograms superimposed and arranged to interact with incident light beams to produce the uniformly polarised measurement beam.
The method as claimed in any one of the preceding claims, wherein the method comprises:
The method as claimed in any one of the preceding claims, wherein the method comprises:
The method as claimed in any one of the preceding claims, wherein the method comprises directing the measurement beams through a first polarising element prior to interacting with the object.
The method as claimed in any one of the preceding claims, wherein the method comprises directing the measurement beams through a second polarising element after interacting with the object.
The method as claimed in any one of the preceding claims, wherein the method comprises storing the detected polarization properties associated with the measurement beams without interacting with the object and after interacting with the object in a suitable memory device for processing to determine the measurement of at least one optical characteristic of the object.
The method as claimed in any one of the preceding claims, wherein the method comprises directing the measurement beams through one or more Fourier imaging systems before detecting the polarisation properties.
A system for measuring an optical characteristic of an object, wherein the system comprises:
The system as claimed in any one of the preceding claims, wherein the beam generating arrangement comprises a light source in the form of a laser light source.
A method for measuring an optical characteristic of an object, wherein the method comprises:
Dependencies are inferred from the claim text.