Device Diagnosis System
AssigneeHitachi Industrial Products, Ltd.
InventorsKoichiro NAGATA, Shigeyuki ABE, Tatsuya MAEKAWA
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AssigneeHitachi Industrial Products, Ltd.
InventorsKoichiro NAGATA, Shigeyuki ABE, Tatsuya MAEKAWA
Estimating the term…
It is not possible to easily divide an analysis process according to a torque or a speed change. A device diagnosis system comprises a threshold value arithmetic operation unit that uses a portion of time-series data measured during an operation of a device as reference data, and sets a plurality of threshold values with respect to the reference data, a data division unit that divides the time-series data that match conditions based on the plurality of threshold values as statuses of respective ranges, a feature arithmetic operation unit that calculates a feature (a basic static quantity) thereof from the time-series data in each status, and an abnormality degree arithmetic operation unit that uses another portion of the time-series data measured during the operation of the device as inspection data, and that analyzes and calculates an abnormality degree which is a degree of an abnormality of the inspection data for each status by using the feature with respect to the inspection data.
A device diagnosis system comprising:
Dependencies are inferred from the claim text.