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AssigneeIida Co., Ltd.
InventorsShigeo MIYAKE, Shuichi NOWATARI, Hidemi HANADA
Estimating the term…
An objective of the present invention is to quantitatively estimate the residual stress of an object. The present invention provides a method for estimating the residual stress of an object, the method comprising: irradiating an object with terahertz waves; measuring polarization intensity of the terahertz waves transmitted through or reflected by the object; and calculating tensile stress of the object based on the measured polarization intensity. In one embodiment, calculating the tensile stress includes calculating the tensile stress based on a relationship between polarization intensity and tensile stress derived from: a relationship between polarization intensity and tensile distance; and a relationship between tensile distance and tensile stress.
A method for estimating residual stress of an object, the method comprising:
A system for estimating residual stress of an object, the system comprising a processor configured to:
A non-transitory computer-readable storage medium storing a program for estimating residual stress of an object, the program being executed by a computer system comprising a processor, the program causing the processor to execute processing comprising:
Dependencies are inferred from the claim text.