Detecting system using spectrum measurement device

A detecting system using a spectrum measurement device and configured to detect an object, wherein the detecting system comprises:

• a sampling module and at least two spectrum measurement devices assembled to the sampling module, wherein
• the sampling module is configured to provide an illumination beam to the object and to collect at least two measurement beams reflected by the object to the at least two spectrum measurement devices, wherein the illumination beam has an illumination light waveband, and the at least two measurement beams have the illumination light waveband;
• the at least two spectrum measurement devices comprise a first spectrum measurement device and a second spectrum measurement device, the first spectrum measurement device comprises a digital micromirror device, and the at least two measurement beams comprise a first measurement beam transmitted to the first spectrum measurement device and a second measurement beam transmitted to the second spectrum measurement device, wherein the first spectrum measurement device is configured to detect a portion of the illumination light waveband of the first measurement beam, and at the same time, the second spectrum measurement device is configured to detect another portion of the illumination light waveband of the second measurement beam.