Thermal imaging including an extended short wave infrared light source
AssigneeLightPath Technologies, Inc.
InventorShmuel RUBIN
Life of this patent
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Abstract
An infrared imaging system includes a detector configured to detect wavelengths in a first infrared wavelength band and a second infrared wavelength band, shorter than the first infrared wavelength band, wherein the second infrared wavelength band is an extended short wavelength infrared band; and a light source configured to output light in the second infrared wavelength band to an object radiating the first infrared wavelength.
Claims22
An infrared imaging system, comprising:
- a detector configured to detect wavelengths in a first infrared wavelength band and a second infrared wavelength band, shorter than the first infrared wavelength band, wherein the second infrared wavelength band is an extended short wavelength infrared band;
- and
- a light source configured to output light in the second infrared wavelength band to an object radiating the first infrared wavelength.
A method of detecting an infrared image, comprising:
- providing a detector for detecting a thermal image of an object, the detector configured to detect wavelengths in a first infrared wavelength band, the detector having a field of view;
- illuminating at least a portion of the object with a second infrared wavelength band, shorter than the first infrared wavelength band;
- and
- detecting the first infrared wavelength band.
A method of obtaining information about a target based on infrared wavelengths associated with the target, the method comprising:
- detecting a first infrared wavelength band emitted from a target;
- and
- detecting a second infrared wavelength band, shorter than the first infrared wavelength band, wherein the second infrared wavelength band is an extended short wavelength infrared band, that is output from or reflected by the target.
Dependencies are inferred from the claim text.