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US 2024/0310440 A1Published application
Device under test (dut) measurement circuit having harmonic minimization
AssigneeTexas Instruments Incorporated
InventorsCharles Kasimer SESTOK, IV, David Patrick MAGEE
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Abstract
A circuit comprises a driver circuit, a processing circuit, and a control circuit. The driver circuit has a first frequency control input and a driver output. The processing circuit has a sense input, a second frequency control input, and a parameter output. And the control circuit has a first frequency control output and a second frequency control output, the first frequency control output coupled to the first frequency control input, and the second frequency control output coupled to the second frequency control input.
Claims20
A circuit comprising:
- a driver circuit having a first frequency control input and a driver output;
- a processing circuit having a sense input, a second frequency control input, and a parameter output;
- and
- a control circuit having a first frequency control output and a second frequency control output, the first frequency control output coupled to the first frequency control input, and the second frequency control output coupled to the second frequency control input.
1 more element
A method comprising:
- generating a first signal having a frequency;
- providing a second signal based on the first signal to a device under test (DUT);
- determining control parameters based on a target level of harmonics at the frequency;
- obtaining sense signal samples from the DUT, and processing the sense signal samples, responsive to the control parameters;
- determining a parameter of the DUT based on a result of processing the sense signal samples;
- and
- performing one or more operations based on the parameter.
4 more elements
Dependencies are inferred from the claim text.