Specimen analyzer and specimen analysis method
AssigneeSysmex Corporation
InventorsKota Misawa, Noriyuki Nakanishi, Junya Ikuta, Toru Mizuhashi, Atsushi Kumagai
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AssigneeSysmex Corporation
InventorsKota Misawa, Noriyuki Nakanishi, Junya Ikuta, Toru Mizuhashi, Atsushi Kumagai
Estimating the term…
Disclosed is a specimen analyzer comprising: a rack transport part configured to transport a rack accommodating a plurality of specimen containers; an agitating part configured to agitate a specimen in each of the specimen containers; a suction part configured to suction the specimen from the specimen container; a container transport part configured to transport the specimen container between the rack on the rack transport part, the agitating part, and a suction position for specimen suctioning by the suction part; a measurement part configured to measure a measurement sample prepared from the specimen suctioned by the suction part; and a controller configured to control at least the agitating part, the suction part, and the container transport part, wherein the specimen analyzer is configured such that control by the controller causes, during a period from start to end of agitation of one of the specimen containers, at least one of transferring to the suction position, suctioning of a specimen, and returning to the rack to be executed on another one of the specimen containers.
A specimen analyzer comprising:
A specimen analysis method to be performed by a specimen analyzer configured to analyze a specimen contained in a specimen container, the specimen analysis method comprising:
Dependencies are inferred from the claim text.