Metasurface for Complex Permittivity Characterization of Dielectric Materials and the Use thereof
AssigneeGeorgia Tech Research Corporation
InventorsChristopher T. Howard, Kenneth Wayne Allen, William Daniel Hunt, David R. Reid
Life of this patent
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Abstract
The exemplary system and method for the characterization procedures for complex permittivity of a dielectric material at radio frequencies, including microwave and millimeter-wave wavelengths. The exemplary system and method employ a highly resonant periodic array affixed or placed in proximity thereto to provide a frequency response that varies based on the constituent electromagnetic properties of a sample of dielectric material.
Claims20
A method to perform material or device electromagnetic characterization, the method comprising:
- providing a dielectric test material of interest;
- providing a conductive substrate or elements with a periodic pattern or metasurface in proximity to the dielectric test material to form a test assembly, wherein the conductive substrate or elements are configured to transmit or reflect electromagnetic energy incident upon it with a resonant response with center frequency and resonance shape that varies based on permittivity properties of the dielectric test material;
- directing electromagnetic energy to the test assembly, wherein the directed electromagnetic energy causes interactions between (i) the periodic pattern or metasurface of the conductive substrate or elements, and (ii) the dielectric test material;
- capturing an electromagnetic energy profile of the test assembly;
- and
- determining an electromagnetic property of the test assembly based on the captured electromagnetic energy profile, wherein the electromagnetic property of the test assembly is used as a characterization of the dielectric test material.
A system comprising:
- a test assembly including a conductive periodic pattern or metasurface and a dielectric test material, wherein the conductive substrate or elements are placed in contact with or in proximity to the dielectric test material, and wherein the conductive substrate or elements are configured to transmit or reflect electromagnetic energy incident upon it with a resonant response with center frequency and resonance shape that varies based on permittivity properties of the dielectric test material;
- an antenna configured to capture an electromagnetic energy profile of the test assembly in response to electromagnetic energy directed to the test assembly, wherein the directed electromagnetic energy causes interactions between (i) the periodic pattern or metasurface of the conductive substrate or elements, and (ii) the dielectric test material;
- and
- an analyzer configured to measure and determine an electromagnetic property of the test assembly based on the captured electromagnetic energy profile, wherein the electromagnetic property of the test assembly is used as a characterization of the dielectric test material.
A non-transitory computer readable medium comprising a memory having instructions stored thereon to cause a processor to:
- analyze an electromagnetic energy profile acquired via a test assembly in response to electromagnetic energy directed thereto, wherein the test assembly includes (i) a conductive layer with a periodic pattern or metasurface and (ii) a dielectric test material, wherein the conductive layer is in contact with or positioned in proximity to the dielectric test material, wherein the conductive layer is configured to transmit or reflect electromagnetic energy incident upon it with a resonant response with center frequency and resonance shape that varies based on permittivity properties of the dielectric test material, and wherein the directed electromagnetic energy causes interactions between (i) the periodic pattern or metasurface of the conductive layer, and (ii) the dielectric test material.
Dependencies are inferred from the claim text.