Testing system for high-frequency modulators

A testing system, comprising:

• a testing component configured to hold a modulator;
• a radio frequency (RF) generator;
• an optical power meter;
• and
• an electrical power meter, wherein:
• the RF generator is configured to generate and provide a first plurality of RF signals in association with a first process,
• wherein the first plurality of RF signals are associated with a plurality of frequencies,
• the optical power meter is configured to measure an optical power of an output optical signal emitted by the modulator,
• wherein the output optical signal is modulated by the modulator based on the plurality of frequencies,
• the RF generator is configured to generate and provide a second plurality of RF signals in association with a second process,
• wherein the second plurality of RF signals are associated with a plurality of frequencies, and
• the electrical power meter is configured to measure a portion of each RF signal of the second plurality of RF signals.

A method, comprising:

• identifying, by a controller of a testing system for a modulator, a maximum value and a minimum value of an optical transfer function that is associated with the modulator;
• causing, by the controller, the modulator to be biased with a particular voltage that is associated with one of the maximum value or the minimum value of the optical transfer function;
• and
• causing, by the controller, a radio frequency (RF) generator of the testing system to generate and provide a plurality of RF signals,
• wherein the plurality of RF signals are associated with a plurality of frequencies.