Method and system for testing device under test (dut) over long distance
AssigneeKeysight Technologies, Inc.
InventorKeith Frederick Anderson
Life of this patent
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AssigneeKeysight Technologies, Inc.
InventorKeith Frederick Anderson
Estimating the term…
A method and system synchronize first and second VNAs for testing a DUT over a long distance. The method includes receiving at the second VNA an RF signal from the first VNA; mixing the RF signal and an LO signal at the second VNA to output an IF signal to an ADC; determining a reference error ratio between a first reference clock in the first VNA and a second reference clock in the second VNA; adjusting an LO frequency to a corrected LO frequency by applying the reference error to a desired LO frequency; mixing the RF signal and the adjusted LO signal to output the IF signal; and resampling the IF signal at an adjusted sample rate to output a corrected IF signal corrected for the reference error, without adjustments being made to the first or second reference clock.
A system for testing a device under test (DUT) over a long distance, the system comprising:
A system for testing a device under test (DUT) over a long distance, the system comprising:
A method of synchronizing a first vector network analyzer (VNA) and a second VNA for testing a device under test (DUT) over a long distance, wherein the first VNA includes a first local oscillator (LO) for generating a first LO signal having a first LO frequency and a first analog to digital converter (ADC), wherein the second VNA includes a second LO for generating a second LO signal having a second LO frequency and a second ADC, and wherein the first VNA and the second VNA do not share a reference clock or a trigger signal, the method comprising:
Dependencies are inferred from the claim text.