Automated optimization of error-handling flows in memory devices
AssigneeMicron Technology, Inc.
InventorsJay Sarkar, Ipsita Ghosh, Vamsi Pavan Rayaprolu
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Abstract
Systems and methods are disclosed including a memory device and a processing device operatively coupled to the memory device. The processing device can perform operations including selecting sample data residing in the memory device; running a test on the sample data regarding a set of error-handling operations; and generating log data comprising a first order of the set of error-handling operations to be performed on data residing in a segment of the memory device.
Claims20
A memory sub-system comprising:
- a memory device;
- and
- a processing device, operatively coupled to the memory device, to perform operations comprising:
- selecting sample data residing in the memory device;
- running a test on the sample data regarding a set of error-handling operations;
- and
- generating log data comprising a first order of the set of error-handling operations to be performed on data residing in a segment of the memory device.
A method, comprising:
- selecting, by a processing device, sample data residing in a memory device;
- running a test on the sample data regarding a set of error-handling operations;
- and
- generating log data comprising a first order of the set of error-handling operations to be performed on data residing in a segment of the memory device.
A non-transitory computer-readable storage medium comprising instructions that, when executed by a processing device operatively coupled to a memory device, performs operations comprising:
- selecting sample data residing in the memory device;
- running a test on the sample data regarding a set of error-handling operations;
- and
- generating log data comprising a first order of the set of error-handling operations to be performed on data residing in a segment of the memory device.
Dependencies are inferred from the claim text.