Scan fragmentation in memory devices
AssigneeMicron Technology, Inc.
InventorsVamsi Pavan Rayaprolu, Christopher M. Smitchger, Saeed Sharifi Tehrani
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AssigneeMicron Technology, Inc.
InventorsVamsi Pavan Rayaprolu, Christopher M. Smitchger, Saeed Sharifi Tehrani
Estimating the term…
A memory system includes a memory device and a processing device, operatively coupled to the memory device. The processing device performs operations comprising: identifying one or more mandatory scan wordlines of the memory device and one or more remaining wordlines of the memory device; performing a plurality of scan iterations with respect to a plurality of pages of the memory device, such that performing each scan iteration comprises: identifying, among the remaining wordlines, one or more scheduled scan wordlines of the memory device, scanning a subset of pages of the memory device that are addressable by the mandatory scan wordlines and the scheduled scan wordlines; wherein a combination of a first plurality of pages addressable by the scheduled scan wordlines selected by the plurality of scan iterations and a second plurality of pages addressable by the mandatory wordlines comprises the plurality of pages of the memory device.
A system comprising:
A method, comprising:
A non-transitory computer-readable storage medium comprising executable instructions that, when executed by a processing device, cause the processing device to perform operations comprising:
Dependencies are inferred from the claim text.