System and Method for Managing Storage Saturation in Storage Systems
AssigneeDell Products L.P.
InventorsGajanan S. Natu, Rasa Raghavan, Steven A . Morley
Life of this patent
Estimating the term…
Abstract
A method, computer program product, and computing system for measuring a total storage device throughput value for a workload processed on a storage device within a storage array enclosure of a storage system. A maximum storage device throughput value may be determined for the workload. A storage device saturation value for the storage device may be determined based upon, at least in part, the total storage device throughput value for the workload and the maximum storage device throughput value for the workload. One or more IO requests may be processed on the storage device based upon, at least in part, the storage device saturation value determined for the storage device.
Claims20
A computer-implemented method, executed on a computing device, comprising:
- measuring a total storage device throughput value for a workload processed on a storage device within a storage array enclosure of a storage system;
- determining a maximum storage device throughput value for the workload;
- determining a storage device saturation value for the storage device based upon, at least in part, the total storage device throughput value for the workload and the maximum storage device throughput value for the workload;
- and
- processing one or more IO requests on the storage device based upon, at least in part, the storage device saturation value determined for the storage device.
A computer program product residing on a non-transitory computer readable medium having a plurality of instructions stored thereon which, when executed by a processor, cause the processor to perform operations comprising:
- measuring a total storage device throughput value for a workload processed on a storage device within a storage array enclosure of a storage system;
- determining a maximum storage device throughput value for the workload;
- determining a storage device saturation value for the storage device based upon, at least in part, the total storage device throughput value for the workload and the maximum storage device throughput value for the workload;
- and
- processing one or more IO requests on the storage device based upon, at least in part, the storage device saturation value determined for the storage device.
A computing system comprising:
- a memory;
- and
- a processor configured to measure a total storage device throughput value for a workload processed on a storage device within a storage array enclosure of a storage system, wherein the processor is further configured to determine a maximum storage device throughput value for the workload, wherein the processor is further configured to determine a storage device saturation value for the storage device based upon, at least in part, the total storage device throughput value for the workload and the maximum storage device throughput value for the workload, and wherein the processor is further configured to process one or more IO requests on the storage device based upon, at least in part, the storage device saturation value determined for the storage device.
Dependencies are inferred from the claim text.